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Ȩ Ȩ > ¿¬±¸¹®Çå > ±¹³» ³í¹®Áö > Çѱ¹Á¤º¸Åë½ÅÇÐȸ ³í¹®Áö (Journal of the Korea Institute of Information and Communication Engineering)

Çѱ¹Á¤º¸Åë½ÅÇÐȸ ³í¹®Áö (Journal of the Korea Institute of Information and Communication Engineering)

Current Result Document :

ÇѱÛÁ¦¸ñ(Korean Title) ·ÎÁö½ºÆ½ °î¼±À» ÀÌ¿ëÇÑ Å¸´ç¼º
¿µ¹®Á¦¸ñ(English Title) Reasonability of Logistic Curve on S/W
ÀúÀÚ(Author) ±è¼±ÀÏ   ÃֱԽĠ  Á¶ÀÎÁØ   Sun-il Kim   Gyu-Shik Che   In-June Jo  
¿ø¹®¼ö·Ïó(Citation) VOL 12 NO. 01 PP. 0001 ~ 0009 (2008. 01)
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(Korean Abstract)
¼ÒÇÁÆ®¿þ¾îÀÇ Å×½ºÆ®³ë·Â °î¼±À¸·Î¼­ ÇöÀç±îÁö´Â ·ÎÁö½ºÆ½ °î¼±ÀÌ °¡Àå ÀÌ»óÀûÀÎ °ÍÀ¸·Î ¿¬±¸µÇ°í ÀÖ´Ù. Å×½ºÆ® ´Ü°èÁß¿¡ ¼Ò¿äµÇ´Â Å×½ºÆ®³ë·ÂÀÇ ¾ç¿¡ ´ëÇÑ °áÇÔ °ËÃâºñ¸¦ ÇöÀçÀÇ °áÇÔ ³»¿ë¿¡ ºñ·ÊÇÏ´Â °ÍÀ¸·Î °¡Á¤ÇÏ¿© ¼ÒÇÁÆ®¿þ¾î ½Å·Úµµ ¼ºÀå ¸ðµ¨À» ºñµ¿Â÷ Æ÷¾Æ¼Û ÇÁ·Î¼¼½º(NHPP)·Î °ø½ÄÈ­ÇϵÇ, ÀÌ ¸ðµ¨À» ÀÌ¿ëÇÏ¿© ¼ÒÇÁÆ®¿þ¾î ½Å·Úµµ ôµµ¿¡ ´ëÇÑ µ¥ÀÌÅÍ ºÐ¼®±â¹ýÀ» °³¹ßÇÑ´Ù. ¸ðµç ¼ÒÇÁÆ®¿þ¾î °³¹ß ȯ°æ¿¡¼­ Áö±Ý±îÁö Á¦½ÃµÈ ¿©·¯ °î¼±Áß Çϳª¿¡ ÀÇÇؼ­ Å×½ºÆ®³ë·Â ¼Ò¿ä °î¼±À» Ç¥ÇöÇÏ´Â °ÍÀº ÀûÀýÇÏÁö ¸øÇÏ´Ù´Â °ÍÀÌ ¹àÇôÁö°í ÀÖ´Ù. ±×·¯¹Ç·Î, º» ³í¹®¿¡¼­´Â ·ÎÁö½ºÆ½ Å×½ºÆ®³ë·Â °î¼±ÀÌ ¼ÒÇÁÆ®¿þ¾îÀÇ °³¹ß/Å×½ºÆ® ³ë·Â°î¼±À¸·Î ÀûÀýÇÏ°Ô Ç¥ÇöµÉ ¼ö ÀÖ´Ù´Â °Í°ú ½ÇÁ¦ µ¥ÀÌÅ͸¦ ±Ù°Å·Î ÇÏ¿© Àû¿ëÇÏ¿©¼­ ¿¹Ãø¼ºÀÌ ¸Å¿ì ÁÁÀº ´É·ÂÀ» °¡Áö°í ÀÖ´Ù´Â °ÍÀ» º¸ÀÌ°íÀÚ ÇÑ´Ù.
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(English Abstract)
The Logistic curve is studied as a most desirable for the software testing effort. Assuming that the error detection rate to the amount of testing effort spent during the testing phase is proportional to the current error content, a software-reliability growth model is formulated by a nonhomogeneous Poisson process. Using this model the method of data analysis for software reliability measurement is developed. After defining a software reliability, This paper discusses the relations between testing time and reliability and between duration following failure fixing and reliability are studied. SRGM in several literatures has used the exponential curve, Railleigh curve or Weibull curve as an amount of testing effort during software testing phase. However, it might not be appropriate to represent the consumption curve for testing effort by one of already proposed curves in some software development environments. Therefore, this paper shows that a logistic testing- effort function can be adequately expressed as a software development/testing effort curve and that it gives a good predictive capability based on real failure data.
Å°¿öµå(Keyword) mean-value-function   NHPP   SRGM   Logistic testing efforts function   target reliability  
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